Retrieval of the Characteristics and Determination of the Parameters of Statistical Nanometer Surface Roughness using the Data on Scattering in a Planar Optical Waveguide in the Presence of Additive Noise

Author： Egorov A.A.  

Publisher： Springer Publishing Company

ISSN： 0033-8443

Source： Radiophysics and Quantum Electronics, Vol.45, Iss.7, 2002-07, pp. : 527-533

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