Author： Chang Tsun-Hsu
Publisher： Springer Publishing Company
ISSN： 0195-9271
Source： International Journal of Infrared and Millimeter Waves, Vol.26, Iss.3, 2005-03, pp. : 409-419
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
This study presents a means to probe the electric-field distribution in a microstrip resonator using the existing power/ground pins. The strength of the electric-field could be correlated with the reflection coefficient. Physical mechanism for the position-depended reflection effect is interpreted from the perspective of probe coupling. An application of this method is demonstrated through three phases: determining the maximum field of a microstrip resonator, shaping the geometry at the field bulk, and detuning the resonant frequency of a power distribution network. The results reveal that this approach can be employed to achieve a resonance-free operating environment.
Related content
International Journal of Infrared and Millimeter Waves, Vol. 27, Iss. 1, 2006-01 ,pp. :
Access to resources
Recommend
Access to resources