Observation of iron impurity diffusion in silicon under bending stress by Mössbauer spectroscopy

Author: Suzuki K.   Yoshida Y.   Hayakawa K.   Yukihira K.   Ichino M.   Asahi K.  

Publisher: Springer Publishing Company

ISSN: 0304-3843

Source: Hyperfine Interactions, Vol.197, Iss.1-3, 2010-04, pp. : 213-217

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Abstract