Phase transformation behavior of (Pb,La)(Zr,Sn,Ti)O3 and Pb (Nb,Zr,Sn,Ti)O3 antiferroelectric thin films deposited on LaNiO3-buffered silicon substrates by sol-gel processing

Author: Zhai Jiwei   Shen Bo   Yao Xi   Xu Zhengkui   Li Xin   Chen Haydn  

Publisher: Springer Publishing Company

ISSN: 0928-0707

Source: Journal of Sol-Gel Science and Technology, Vol.42, Iss.3, 2007-06, pp. : 369-373

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Abstract