Steady-State and Transient Electron Transport Within the III–V Nitride Semiconductors, GaN, AlN, and InN: A Review

Author: O'Leary Stephen   Foutz Brian   Shur Michael   Eastman Lester  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.17, Iss.2, 2006-02, pp. : 87-126

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Abstract