![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Vidhya V. Vatsala Rani J. Ratheesh Kumar A. Thangamuthu R. Murali K. Jayachandran M.
Publisher: Springer Publishing Company
ISSN: 0957-4522
Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.9, 2011-09, pp. : 1460-1465
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Ou Rongxian Xie Yanjun Shen Xiaoping Yuan Feipin Wang Haigang Wang Qingwen
Journal of Materials Science, Vol. 47, Iss. 16, 2012-08 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Baka O. Azizi A. Velumani S. Schmerber G. Dinia A.
Journal of Materials Science: Materials in Electronics, Vol. 25, Iss. 4, 2014-04 ,pp. :