Materials characterization using high-resolution scanning-electron microscopy and x-ray microanalysis

Author: Gauvin Raynald   Robertson Kevin   Horny Paula   Elwazri Adbelbaset   Yue Steve  

Publisher: Springer Publishing Company

ISSN: 1543-1851

Source: JOM, Vol.58, Iss.3, 2006-03, pp. : 20-26

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Abstract