X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM)

ISSN： 1757-899X

Source： IOP Conference Series: Materials Science and Engineering, Vol.32, Iss.1, 2012-03, pp. : 152-170

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Materials characterization using high-resolution scanning-electron microscopy and x-ray microanalysis

By Gauvin Raynald Robertson Kevin Horny Paula Elwazri Adbelbaset Yue Steve

JOM, Vol. 58, Iss. 3, 2006-03 ,pp. : 20-26

Springer Publishing Company

Access to resources Recommend Favorite

Low voltage imaging and X-ray microanalysis in the SEM: challenges and opportunities

IOP Conference Series: Materials Science and Engineering, Vol. 109, Iss. 1, 2016-02 ,pp. : 216-229

IOP Publishing

Access to resources Recommend Favorite

Identification of corrosion and damage mechanisms by using scanning electron microscopy and energy-dispersive X-ray microanalysis: contribution to failure analysis case histories

IOP Conference Series: Materials Science and Engineering, Vol. 55, Iss. 1, 2014-03 ,pp. : 145-152

IOP Publishing

Access to resources Recommend Favorite

X-ray microanalysis of volcanic ash

IOP Conference Series: Materials Science and Engineering, Vol. 32, Iss. 1, 2012-03 ,pp. : 127-137

IOP Publishing

Access to resources Recommend Favorite

Abandoned mine slags analysis by EPMA WDS X-ray mapping

IOP Conference Series: Materials Science and Engineering, Vol. 7, Iss. 1, 2010-02 ,pp. : 89-96

IOP Publishing

Access to resources Recommend Favorite