Depth Profiling of Hf-Doped Aluminide Coating by Glow-Discharge Mass Spectrometry

Author： He L.M.   Putyera K.   Meyer J.D.   Walker L.R.   Lee W.Y.  

Publisher： Springer Publishing Company

ISSN： 1543-1940

Source： Metallurgical and Materials Transactions A, Vol.33, Iss.11, 2002-11, pp. : 3578-3582

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