Multi-scale strategy for high-k/metal-gate UTBB-FDSOI devices modeling with emphasis on back bias impact on mobility

Author： Nier O. Rideau D. Niquet Y. Monsieur F. Nguyen V. Triozon F. Cros A. Clerc R. Barbé J. Palestri P. Esseni D. Duchemin I. Smith L. Silvestri L. Nallet F. Tavernier C. Jaouen H. Selmi L.

Publisher： Springer Publishing Company

ISSN： 1569-8025

Source： Journal of Computational Electronics, Vol.12, Iss.4, 2013-12, pp. : 675-684

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