Measurement of the Differential Pockels and Kerr Coefficients of Thin Films by a Two-Beam Polarization Interferometer with a Reflection Configuration

Author： Spirin V. V.   Mendieta F. J.   No Kwangsoo  

Publisher： Taylor & Francis Ltd

ISSN： 0015-0193

Source： Ferroelectrics, Vol.271, Iss.1, 2002-01, pp. : 321-326

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