Author: Han Hyoung-Su Do Nam-Binh Pham Ky-Nam Jang Hyun-Deok Tran Vu Diem Ngoc Tai Weon-Pil Lee Jae-Shin
Publisher: Taylor & Francis Ltd
ISSN: 0015-0193
Source: Ferroelectrics, Vol.421, Iss.1, 2011-01, pp. : 88-91
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Abstract