DLTS and in situ C-V analysis of trap parameters in swift 50 MeV Li3+ ion-irradiated Ni/SiO2/Si MOS capacitors

Author: Shashank N.   Singh Vikram   Gupta Sanjeev   Madhu K. V.   Akhtar J.   Damle R.  

Publisher: Taylor & Francis Ltd

ISSN: 1042-0150

Source: Radiation Effects and Defects in Solids, Vol.166, Iss.4, 2011-04, pp. : 313-322

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