Swift heavy ion-induced interface mixing in a Si–Nb thin film system

Author: Diva K.   Chauhan R. S.   Kumar Sarvesh   Chakraborty B. R.  

Publisher: Taylor & Francis Ltd

ISSN: 1042-0150

Source: Radiation Effects and Defects in Solids, Vol.166, Iss.8-9, 2011-09, pp. : 696-702

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