Author: Pratap Deepti Kumar Vijay Jain Anshul Gupta A. Kumar Sarvesh Sulania I. Tripathi A. Chauhan R. S.
Publisher: Taylor & Francis Ltd
ISSN: 1042-0150
Source: Radiation Effects and Defects in Solids, Vol.168, Iss.7-8, 2013-08, pp. : 607-614
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on Si
By Bibic N. Milosavljevic M. Perusko D. Jeynes C.
Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. :
Nanoscale ion-beam mixing in Au–Si and Ag–Si eutectic systems
By Satpati B. Satyam P.V. Som T. Dev B.N.
Applied Physics A, Vol. 79, Iss. 3, 2004-08 ,pp. :