Influence of Post Deposition Annealing Process on the Optical and Microwave Dielectric Properties of Bi1.5Zn1.0Nb1.5O7 Thin Films

Author： Sudheendran K.   Raju K.C. James  

Publisher： Taylor & Francis Ltd

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.119, Iss.1, 2010-01, pp. : 89-95

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