I-V Characteristics of a Static Random Access Memory Cell Utilizing Ferroelectric Transistors

Author: Mccartney Crystal Laws   Mitchell Cody   Hunt Mitchell   Macleod Todd C.   Ho Fat D.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.140, Iss.1, 2012-01, pp. : 35-41

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract