Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of Piezoresponse Measurements on Ferroelectric Thin Films

Author: Harnagea Catalin   Pignolet Alain   Alexe Marin   Hesse Dietrich  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.44, Iss.1, 2002-01, pp. : 113-124

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Abstract