DIELECTRIC CONSTANT AND LOSS TANGENT OF THIN FERROELECTRIC FILMS AT MICROWAVE FREQUENCIES—HOW ACCURATELY CAN WE EVALUATE THEM?

Author: Petrov Peter   Pan Yuya   Zou Bin   Alford Neil McN  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.97, Iss.1, 2008-01, pp. : 27-37

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