Separation of Near Interface Regions From Central Bulk in a Ferroelectric Thin Film

Author: Chu D. P.   Zhang Z. G.   Migliorato P.   McGregor B. M.   Ohashi K.   Hasegawa K.   Shimoda T.  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.50, Iss.1, 2002-01, pp. : 171-180

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Abstract