Author: Chu D. P. Zhang Z. G. Migliorato P. McGregor B. M. Ohashi K. Hasegawa K. Shimoda T.
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.50, Iss.1, 2002-01, pp. : 171-180
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Abstract
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