Author: WATTS B. LECCABUE F. TALLARIDA G. FERRARI S. FANCIULLI M. PADELETTI G.
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.62, Iss.1, 2004-01, pp. : 3-11
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Dielectric breakdown of PDMS thin films
By Gerratt Aaron P. Bergbreiter Sarah
Journal of Micromechanics and Microengineering, Vol. 23, Iss. 6, 2013-06 ,pp. :
Surface oxidation of aluminium nitride thin films
By Watanabe Y. Hara Y. Tokuda T. Kitazawa N. Nakamura Y.
Surface Engineering, Vol. 16, Iss. 3, 2000-06 ,pp. :