EFFECT OF ANNEALING TEMPERATURE ON LEAKAGE CURRENT CHARACTERISTICS OF Bi 3.25 La 0.75 Ti 3 O 12 THIN FILMS PREPARED BY SOL-GEL METHOD

By YU JUN   DONG-YUN GUO   YUN-BO WANG   JUN-XIONG GAO  

Integrated Ferroelectrics, Vol. 79, Iss. 1, 2006-11 ,pp. : 97-103

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Retention Characteristic of Bi3.25La0.75Ti3O12 Thin Films Prepared by Metalorganic Decomposition

By Zhang X. S.   Zhu J. S.   Lu X. M.   Wang Y. N.  

Integrated Ferroelectrics, Vol. 47, Iss. 1, 2002-01 ,pp. : 135-141

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ELECTRICAL CHARACTERIZATIONS OF Bi 3.25 La 0.75 Ti 3 O 12 THIN FILMS ON THERMALLY OXIDIZED p -Si SUBSTRATES

By PAK JAEMOON   KO EUNJUNG   BAEK JONGHO   NAM KUANGWOO   PARK GWANGSEO  

Integrated Ferroelectrics, Vol. 79, Iss. 1, 2006-11 ,pp. : 163-170

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THE EFFECT OF A-SITE La AND Nd SUBSTITUTION ON THE RESIDUAL STRESS OF Bi4Ti3O12 THIN FILMS FABRICATED BY SOL-GEL METHOD

By LI JIANJUN   LI JIA   PENG GANG   WANG YUNBO   YU JUN  

Integrated Ferroelectrics, Vol. 110, Iss. 1, 2009-01 ,pp. : 80-86

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Structural and Electrical Properties of Bi3.25La0.75Ti3O12 and Bi3.25Pr0.75Ti3O12 Thin Films for Memory Applications

By Wu Di   Li Aidong   Liu Zhiguo   Ming Naiben  

Integrated Ferroelectrics, Vol. 45, Iss. 1, 2002-01 ,pp. : 177-182

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