CHARACTERISTICS OF Bi 3.25 La 0.75 Ti 3 O 12 THIN FILMS ON p-Si WITH A BUFFER LAYER OF Bi 4 Ti 3 O 12 PREPARED BY SOL-GEL METHOD

By YU JUN   DONG-YUN GUO   YUN-BO WANG   JUN-XIONG GAO  

Integrated Ferroelectrics, Vol. 79, Iss. 1, 2006-11 ,pp. : 89-95

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CO-EFFECT OF ANNEALING TEMPERATURE AND AMBIENT ON FERROELECTRIC PROPERTIES OF Bi3.25La0.75Ti3O12 FILMS

By LI JIANJUN   YU JUN   LI JIA   YANG WEIMING   WANG YUNBO  

Integrated Ferroelectrics, Vol. 110, Iss. 1, 2009-01 ,pp. : 43-54

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Retention Characteristic of Bi3.25La0.75Ti3O12 Thin Films Prepared by Metalorganic Decomposition

By Zhang X. S.   Zhu J. S.   Lu X. M.   Wang Y. N.  

Integrated Ferroelectrics, Vol. 47, Iss. 1, 2002-01 ,pp. : 135-141

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THE EFFECT OF A-SITE La AND Nd SUBSTITUTION ON THE RESIDUAL STRESS OF Bi4Ti3O12 THIN FILMS FABRICATED BY SOL-GEL METHOD

By LI JIANJUN   LI JIA   PENG GANG   WANG YUNBO   YU JUN  

Integrated Ferroelectrics, Vol. 110, Iss. 1, 2009-01 ,pp. : 80-86

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STRESS EFFECTS ON Bi 3.25 La 0.75 Ti 3 O 12 THIN FILMS

By WU XIUMEI   LU XIAOMEI   GUO YI   WU XIAOSHAN   CAI HONGLIN   ZHU JINSONG  

Integrated Ferroelectrics, Vol. 79, Iss. 1, 2006-11 ,pp. : 47-54

Taylor & Francis Ltd

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