DEFECT ENGINEERING FOR CONTROL OF POLARIZATION FATIGUE IN Bi 3.25 La 0.75 Ti 3 O 12 THIN FILM CAPACITORS

By SINGH S.   ISHIWARA H.  

Integrated Ferroelectrics, Vol. 79, Iss. 1, 2006-11 ,pp. : 25-35

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FERROELECTRIC PROPERTIES OF Zr-DOPED Bi3.25La0.75Ti3O12 THIN FILM DEPOSITED BY RF MAGNETRON SPUTTERING

By Wu Yunyi   Yu Jun   Zhang Duanming   Zheng Chaodan   Wang Yunbo  

Integrated Ferroelectrics, Vol. 94, Iss. 1, 2007-10 ,pp. : 37-46

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EFFECT OF ANNEALING TEMPERATURE ON LEAKAGE CURRENT CHARACTERISTICS OF Bi 3.25 La 0.75 Ti 3 O 12 THIN FILMS PREPARED BY SOL-GEL METHOD

By YU JUN   DONG-YUN GUO   YUN-BO WANG   JUN-XIONG GAO  

Integrated Ferroelectrics, Vol. 79, Iss. 1, 2006-11 ,pp. : 97-103

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Structural and Electrical Properties of Bi3.25La0.75Ti3O12 and Bi3.25Pr0.75Ti3O12 Thin Films for Memory Applications

By Wu Di   Li Aidong   Liu Zhiguo   Ming Naiben  

Integrated Ferroelectrics, Vol. 45, Iss. 1, 2002-01 ,pp. : 177-182

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Retention Characteristic of Bi3.25La0.75Ti3O12 Thin Films Prepared by Metalorganic Decomposition

By Zhang X. S.   Zhu J. S.   Lu X. M.   Wang Y. N.  

Integrated Ferroelectrics, Vol. 47, Iss. 1, 2002-01 ,pp. : 135-141

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