Author: Ykhlef F. Bensebti M.
Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.100, Iss.3, 2013-03, pp. : 393-407
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Edge detection using ACO and
By Ari Samit Ghosh Dipak Mohanty Prashant
Signal, Image and Video Processing, Vol. 8, Iss. 4, 2014-05 ,pp. :
The total dose effects on the 1/
By Rongbin Hu Yuxin Wang Wu Lu
Journal of Semiconductors, Vol. 35, Iss. 2, 2014-02 ,pp. :