Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ ƒ ) noise

Author： Kirton M.J.   Uren M.J.  

Publisher： Taylor & Francis Ltd

ISSN： 1460-6976

Source： Advances In Physics, Vol.38, Iss.4, 1989-01, pp. : 367-468

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Diode laser noise-spectroscopy of low-frequency atomic fluctuations in rubidium vapor

By Valente P.  

The European Physical Journal D - Atomic, Molecular and Optical Physics, Vol. 50, Iss. 2, 2008-12 ,pp. : 133-140

Springer Publishing Company

Access to resources Recommend Favorite

Low-frequency excess noise induced by hot-carrier injection in polysilicon thin-film transistors

By Bove A.   Giovannini S.   Valletta A.   Mariucci L.   Pecora A.   Fortunato G.  

Thin Solid Films, Vol. 383, Iss. 1, 2001-02 ,pp. : 147-150

Elsevier

Access to resources Recommend Favorite

Controlled Low‐Frequency Electrical Noise of Monolayer MoS2 with Ohmic Contact and Tunable Carrier Concentration

By  

ADVANCED ELECTRONIC MATERIALS, Vol. 4, Iss. 1, 2018-01 ,pp. : n/a-n/a

John Wiley & Sons Inc

Access to resources Recommend Favorite

Solid-state defects in calcined CaA zeolite

By Oka H.   Kamioka K.   Tokunaga Y.   Okada T.  

Zeolites, Vol. 19, Iss. 5, 1997-11 ,pp. : 455-457

Elsevier

Access to resources Recommend Favorite

Low-frequency Raman investigation of tunnelling states in glasses

By Terki F.   Prat J.-L.   Pelous J.  

Philosophical Magazine B, Vol. 77, Iss. 2, 1998-02 ,pp. : 373-380

Taylor & Francis Ltd

Access to resources Recommend Favorite