Low-frequency excess noise induced by hot-carrier injection in polysilicon thin-film transistors

Author: Bove A.   Giovannini S.   Valletta A.   Mariucci L.   Pecora A.   Fortunato G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 147-150

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Abstract