Author: Tong S. Y.
Publisher: Taylor & Francis Ltd
ISSN: 1460-6976
Source: Advances In Physics, Vol.48, Iss.1, 1999-01, pp. : 135-165
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Low-energy electron diffraction (LEED) study of an aperiodic thin film of Cu on 5-fold i-Al-Pd-Mn
By Pussi K.
Philosophical Magazine, Vol. 88, Iss. 13-15, 2008-05 ,pp. :