Low-energy electron diffraction, Scanning tunneling microscopy and X-ray photoemission spectroscopy investigations of DMe-DCNQI on Cu(110)

Author: Kopf H.   Seidel C.   Fuchs H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.342, Iss.1, 1999-03, pp. : 307-311

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