Glancing-incidence and glancing-takeoff X-ray fluorescence analysis of a Mn ultrathin film on an Au layer

By Tsuji K.   Sato S.   Hirokawa K.  

Thin Solid Films, Vol. 274, Iss. 1, 1996-03 ,pp. : 18-22

Elsevier

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Molecular packing in new Langmuir-Blodgett systems investigated by X-ray specular reflectivity and grazing incidence X-ray diffraction

By Giannini C.   Tapfer L.   Sauvage-Simkin M.   Garreau Y.   Jedrecy N.   Veron M.B.   Pinchaux R.   Burghard M.   Roth S.  

Thin Solid Films, Vol. 288, Iss. 1, 1996-11 ,pp. : 272-278

Elsevier

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X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films

By Li B.   Fujimoto T.   Fukumoto N.   Honda K.   Kojima I.  

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 140-144

Elsevier

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Depth profiling of thin ITO films by grazing incidence X-ray diffraction

By Vink T.J.   Neerinck D.G.  

Thin Solid Films, Vol. 278, Iss. 1, 1996-05 ,pp. : 12-17

Elsevier

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Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction

By Ma C.-H.   Huang J.-H.   Chen H.  

Thin Solid Films, Vol. 418, Iss. 2, 2002-10 ,pp. : 73-78

Elsevier

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