Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

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Thin Solid Films, Vol. 372, Iss. 1, 2000-09 ,pp. : 94-103

Elsevier

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Depth profiling of thin ITO films by grazing incidence X-ray diffraction

By Vink T.J.   Neerinck D.G.  

Thin Solid Films, Vol. 278, Iss. 1, 1996-05 ,pp. : 12-17

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X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

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Thin Solid Films, Vol. 258, Iss. 1, 1995-03 ,pp. : 110-114

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Study of ultra-thin hydrogen silsesquioxane films using X-ray reflectivity

By Wu W.-L.   Liou H.-C.  

Thin Solid Films, Vol. 312, Iss. 1, 1998-01 ,pp. : 73-77

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Molecular packing in new Langmuir-Blodgett systems investigated by X-ray specular reflectivity and grazing incidence X-ray diffraction

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