High-resolution identification of stacking faults in epitaxial Ba 0.3 Sr 0.7 TiO 3 thin films

Author: Lu C. J.   Bendersky L. A.   Chang K.   Takeuchi I.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.83, Iss.13, 2003-01, pp. : 1565-1595

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content