Investigation of {111} stacking faults and nanotwins in epitaxial BaTiO 3 thin films by high-resolution transmission electron microscopy

Author: Lei C.H.   Jia C.L.   Siegert M.   Urban K.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.80, Iss.6, 2000-06, pp. : 371-380

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content