Annealing effects on the microstructure of sputtered gold layers on oxidized silicon investigated by scanning electron microscopy and scanning probe microscopy

Author： Plaza J. L.   Jacke S.   Chen Y.   Palmer R. E.  

Publisher： Taylor & Francis Ltd

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.83, Iss.9, 2003-03, pp. : 1137-1142

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