Scanning probe microscopy of organics, an update

Author： Frommer J.E.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.273, Iss.1, 1996-02, pp. : 112-115

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Scanning probe microscopy of automotive anti-wear films

By Smith G.C.   Pidduck A.J.  

Wear, Vol. 212, Iss. 2, 1997-12 ,pp. : 254-264

Elsevier

Access to resources Recommend Favorite

Surface analysis algorithms for scanning probe microscopy

By Lindquist C.   Urban F.K.   Lindquist C.S.   Urban F.K.I.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 399-405

Elsevier

Access to resources Recommend Favorite

Anisotropy in wear processes measured by scanning probe microscopy

By Schouterden K.   Lairson B.M.  

Thin Solid Films, Vol. 340, Iss. 1, 1999-02 ,pp. : 40-44

Elsevier

Access to resources Recommend Favorite

Application of neural networks to a scanning probe microscopy system

By Hadjiiski L.   Linnemann R.   Stopka M.   Oesterschulze E.   Rangelow I.   Kassing R.  

Thin Solid Films, Vol. 264, Iss. 2, 1995-08 ,pp. : 291-297

Elsevier

Access to resources Recommend Favorite

Scanning probe microscopy and spectroscopy of graphene on metals

By  

PHYSICA STATUS SOLIDI (B) BASIC SOLID STATE PHYSICS, Vol. 252, Iss. 3, 2015-03 ,pp. : 451-468

John Wiley & Sons Inc

Access to resources Recommend Favorite