Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

Author： Nečas D   Čudek V   Vodák J   Ohlídal M   Klapetek P   Benedikt J   Rügner K   Zajíčková L  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.25, Iss.11, 2014-11, pp. : 115201-115209

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