Structural properties of a-SiOx:H films studied by an improved infrared-transmission analysis method

Author: Shuo Wang   Xiao-Dan Zhang   Shao-Zhen Xiong   Ying Zhao  

Publisher: IOP Publishing

ISSN: 1674-1056

Source: Chinese Physics B, Vol.23, Iss.9, 2014-09, pp. : 98801-98807

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