Author: Rossier Joël S. Maury Valérie de Voogd Blaise Pfammatter Elmar
Publisher: Swiss Chemical Society
ISSN: 0009-4293
Source: CHIMIA International Journal for Chemistry, Vol.68, Iss.10, 2014-10, pp. : 696-700
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
RAPID COMMUNICATIONS IN MASS SPECTROMETRY, Vol. 29, Iss. 7, 2015-04 ,pp. :
Stoichiometry determination of VO x thin films by 18 O-RBS spectrometry
By Rata A.D. Vongtragool S. Boerma D.O. Hibma T.
Thin Solid Films, Vol. 400, Iss. 1, 2001-12 ,pp. :