An approach to quantitative high-resolution transmission electron microscopy of crystalline materials

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Elsevier

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An approximate multi-beam form of the ''ellipse'' in high-resolution transmission electron microscopy

By Hu J.J.   Tanaka N.  

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Sub-Ångstrom high-resolution transmission electron microscopy at 300keV

By O'Keefe M.A.   Hetherington C.J.D.   Wang Y.C.   Nelson E.C.   Turner J.H.   Kisielowski C.   Malm J.-O.   Mueller R.   Ringnalda J.   Pan M.   Thust A.  

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Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy

By Allen L.J.   Faulkner H.M.L.   Oxley M.P.   Paganin D.  

Ultramicroscopy, Vol. 88, Iss. 2, 2001-07 ,pp. : 85-97

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Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures

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