Sub-Ångstrom high-resolution transmission electron microscopy at 300keV

Author： O'Keefe M.A.   Hetherington C.J.D.   Wang Y.C.   Nelson E.C.   Turner J.H.   Kisielowski C.   Malm J.-O.   Mueller R.   Ringnalda J.   Pan M.   Thust A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.89, Iss.4, 2001-11, pp. : 215-241

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