Optics of high-performance electron microscopesInvited paper.

Publisher： IOP Publishing

ISSN： 1468-6996

Source： Science and Technology of Advanced Materials, Vol.9, Iss.1, 2008-04, pp. : 173-202

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Nanofabrication by advanced electron microscopy using intense and focused beamInvited paper.

By  

Science and Technology of Advanced Materials, Vol. 9, Iss. 1, 2008-01 ,pp. : 311-330

IOP Publishing

Access to resources Recommend Favorite

Nanosecond electron microscopes

By Bostanjoglo O.   Elschner R.   Mao Z.   Nink T.   Weingartner M.  

Ultramicroscopy, Vol. 81, Iss. 3, 2000-04 ,pp. : 141-147

Elsevier

Access to resources Recommend Favorite

Electron energy dependence of characteristics of fluorescent plates for ultrahigh-voltage electron microscopes

By Nishi R.   Yoshida K.   Takaoka A.   Katsuta T.  

Ultramicroscopy, Vol. 62, Iss. 4, 1996-03 ,pp. : 271-275

Elsevier

Access to resources Recommend Favorite

Software package for structure analysis of quasicrystalsInvited paper.

By  

Science and Technology of Advanced Materials, Vol. 9, Iss. 1, 2008-01 ,pp. : 3-14

IOP Publishing

Access to resources Recommend Favorite

High-performance silicon photonics technology for telecommunications applications

By  

Science and Technology of Advanced Materials, Vol. 15, Iss. 2, 2014-04 ,pp. : 74-83

IOP Publishing

Access to resources Recommend Favorite