Author： Nishi R. Yoshida K. Takaoka A. Katsuta T.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.62, Iss.4, 1996-03, pp. : 271-275
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Nanosecond electron microscopes
By Bostanjoglo O. Elschner R. Mao Z. Nink T. Weingartner M.
Ultramicroscopy, Vol. 81, Iss. 3, 2000-04 ,pp. :
Access to resources
Recommend
Optics of high-performance electron microscopesInvited paper.
Science and Technology of Advanced Materials, Vol. 9, Iss. 1, 2008-04 ,pp. :
Access to resources
Performance of imaging plates for electron recording
By Zuo J.M. McCartney M.R. Spence J.C.H.
Ultramicroscopy, Vol. 66, Iss. 1, 1996-11 ,pp. :
An imaging filter for high voltage electron microscopy
By Gubbens A.J. Kraus B. Krivanek O.L. Mooney P.E.
Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. :