Publisher: IOP Publishing
ISSN: 1367-2630
Source: New Journal of Physics, Vol.10, Iss.5, 2008-05, pp. : 156-166
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Dislocation images in high resolution scanning electron microscopy
Revue de Physique Appliquée (Paris), Vol. 9, Iss. 2, 1974-03 ,pp. :
NanoXAS, a novel concept for high resolution microscopy
Journal of Physics: Conference Series , Vol. 186, Iss. 1, 2009-09 ,pp. :
Ultra-high resolution EEL studies of domains in Perovskite
Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. :