Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.186, Iss.1, 2009-09, pp. : 55-57
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A novel method achieving ultra-high geometrical resolution in scanning tunnelling microscopy
New Journal of Physics, Vol. 10, Iss. 5, 2008-05 ,pp. :
Access to resources
Recommend
High Resolution Quantitative Lorentz Microscopy
Journal of Physics: Conference Series , Vol. 644, Iss. 1, 2015-10 ,pp. :
Access to resources
Resolution in High Field Echo Planar Microscopy
Journal of Magnetic Resonance, Vol. 137, Iss. 1, 1999-03 ,pp. :
High-Resolution Electron Microscopy of Nanostructured Materials
Nanoscience & Nanotechnology-Asia, Vol. 1, Iss. 1, 2011-07 ,pp. :