Interface traps density of anodic porous alumina films of different thicknesses on Si

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.10, Iss.1, 2005-01, pp. : 222-225

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Growth of copper-indium nanorods on Si substrate using porous anodic alumina as template

Journal of Physics: Conference Series , Vol. 188, Iss. 1, 2009-09 ,pp. : 155-158

IOP Publishing

Access to resources Recommend Favorite

Transport properties of anodic porous alumina for ReRAM

Journal of Physics: Conference Series , Vol. 109, Iss. 1, 2008-03 ,pp. : 81-84

IOP Publishing

Access to resources Recommend Favorite

Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN_x matrix by the influence of near-interface oxide traps

By Fang Zhong-Hui Jiang Xiao-Fan Chen Kun-Ji Yue-Fei Wang Wei Li Jun Xu

Chinese Physics B, Vol. 24, Iss. 1, 2015-01 ,pp. : 17305-17309

IOP Publishing

Access to resources Recommend Favorite

Ferroelectric Nanotubes Array Growth in Anodic Porous Alumina Nanoholes on Silicons

By Min Hyung-Seob Lee Jeon-Kook

Ferroelectrics, Vol. 336, Iss. 1, 2006-01 ,pp. : 231-235

Taylor & Francis Ltd

Access to resources Recommend Favorite

Two-dimensional porous anodic alumina for optoelectronics and photocatalytic application

Journal of Physics: Conference Series , Vol. 643, Iss. 1, 2015-11 ,pp. : 549-553

IOP Publishing

Access to resources Recommend Favorite