Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiNx matrix by the influence of near-interface oxide traps

Author： Fang Zhong-Hui   Jiang Xiao-Fan   Chen Kun-Ji   Yue-Fei Wang   Wei Li   Jun Xu  

Publisher： IOP Publishing

E-ISSN： 1741-4199|24|1|17305-17309

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.1, 2015-01, pp. : 17305-17309

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