Progress and research at the Shanghai EBIT

By Hu W   Fu Y   Gong P   Yao K   Lu D   Chen W   Liu Y   Yang Y   Xiao J   Wu S   Geng Z   Huang M   Zhang X   Hutton R   Liljeby L   He M   Zou Y  

Canadian Journal of Physics, Vol. 86, Iss. 1, 2008-01 ,pp. : 321-325

NRC Research Press

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The potential of an EBIT in assisting plasma diagnostics and progress at the Shanghai EBIT

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Journal of Physics: Conference Series , Vol. 185, Iss. 1, 2009-09 ,pp. : 250-255

IOP Publishing

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Progress with the MPIK/UW-PTMS in Heidelberg

By Diehl Christoph  

Hyperfine Interactions, Vol. 199, Iss. 1-3, 2011-07 ,pp. : 291-300

Springer Publishing Company

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High-precision measurements in few-electron highly charged ions at the HeidelbergElectron Beam Ion Trap (EBIT)

By López-Urrutia JR C.   Braun J   Brenner G   Bruhns H   Draganič I N   Martínez AJ González   Lapierre A   Mironov V   Osborne C   Sikler G   Orts R Soria   Tawara H   Ullrich J   Tupitsyn I I   Shabaev V M  

Canadian Journal of Physics, Vol. 83, Iss. 4, 2005-04 ,pp. : 387-393

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The Belfast EBIT

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Journal of Physics: Conference Series , Vol. 2, Iss. 1, 2004-01 ,pp. : 182-189

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