Force microscopy on insulators: imaging of organic molecules

Publisher： IOP Publishing

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.19, Iss.1, 2005-01, pp. : 166-174

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor

By Hussain Danish   Wen Yongbing   Zhang Hao   Song Jianmin   Xie Hui  

Sensors, Vol. 18, Iss. 1, 2018-01 ,pp. : 100-100

MDPI

Access to resources Recommend Favorite

Imaging and force transduction in correlative scanning force and confocal fluorescence microscopy

By  

EPJ Web of Conference, Vol. 190, Iss. issue, 2018-09 ,pp. : 02002-02002

Edp Sciences

Access to resources Recommend Favorite

Dynamic speed control in atomic force microscopy to improve imaging time and quality

By Sikora Andrzej   Bednarz Lukasz  

Measurement Science and Technology, Vol. 25, Iss. 4, 2014-04 ,pp. : 44005-44014

IOP Publishing

Access to resources Recommend Favorite

A simple model of molecular imaging with noncontact atomic force microscopy

By  

New Journal of Physics, Vol. 14, Iss. 8, 2012-08 ,pp. : 382-394

IOP Publishing

Access to resources Recommend Favorite

Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy

By Guillemot C.   Budau P.   Chevrier J.   Marchi F.   Comin F.   Alandi C.   Bertin F.   Buffet N.   Wyon Ch.   Mur P.  

EPL (EUROPHYSICS LETTERS), Vol. 59, Iss. 4, 2010-03 ,pp. : 566-571

Edp Sciences

Access to resources Recommend Favorite