Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.26, Iss.1, 2006-02, pp. : 46-49
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron beam damage in oxides: a review
By Jiang Nan
Reports on Progress in Physics, Vol. 79, Iss. 1, 2016-01 ,pp. :
Access to resources
Recommend
Generating a uniform transverse distributed electron beam along a beam line
Chinese Physics C, Vol. 39, Iss. 11, 2015-11 ,pp. :
Access to resources
Experimental studies of compensation of beam–beam effects with Tevatron electron lenses
New Journal of Physics, Vol. 10, Iss. 4, 2008-04 ,pp. :