Transmission electron microscopy characterisation of permalloy elements fabricated by focussed ion beam lithography

Publisher： IOP Publishing

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.26, Iss.1, 2006-02, pp. : 187-190

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Quantum Detection Applications of NanoSQUIDs fabricated by Focussed Ion Beam

By  

Journal of Physics: Conference Series , Vol. 286, Iss. 1, 2011-03 ,pp. : 65-73

IOP Publishing

Access to resources Recommend Favorite

Analysis of Electron Beam Damage of Crystalline Pharmaceutical Materials by Transmission Electron Microscopy

By  

Journal of Physics: Conference Series , Vol. 644, Iss. 1, 2015-10 ,pp. : 156-159

IOP Publishing

Access to resources Recommend Favorite

Sensing Performance of Precisely Ordered TiO2 Nanowire Gas Sensors Fabricated by Electron-Beam Lithography

By Tian Wei-Cheng   Ho Yu-Hsuan   Chen Chao-Hao   Kuo Chun-Yen  

Sensors, Vol. 13, Iss. 1, 2013-01 ,pp. : 865-874

MDPI

Access to resources Recommend Favorite

Transmission Electron Microscopy Study of Graphite under in situ Ion Irradiation

By  

Journal of Physics: Conference Series , Vol. 371, Iss. 1, 2012-07 ,pp. : 187-190

IOP Publishing

Access to resources Recommend Favorite

Multilevel diffractive elements in SiO2 by electron beam lithography and proportional etching with analogue negative resist

By Laakkonen Pasi   Lautanen Jari   Kettunen Ville   Turunen Jari   Schirmer Matthias  

Journal of Modern Optics, Vol. 46, Iss. 8, 1999-07 ,pp. : 1295-1307

Taylor & Francis Ltd

Access to resources Recommend Favorite